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DSU professor’s cryptography paper accepted for ACNS

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Dr. Edoardo Persichetti, assistant professor of mathematics at Dakota State University in Madison, S.D., recently had a cryptography paper accepted for the prestigious 13th International Conference on Applied Cryptography and Network Security (ACNS 2015). The ACNS conference spotlights research submissions from academia, industry and government, presenting novel research on all aspects of applied cryptography as well as network security and privacy. This year’s conference will be held in June at Columbia University in New York City.

Dr. Persichetti’s paper is titled "Leakage-Resilient Cryptography over Large Finite Fields: Theory and Practice,” and was a joint effort with two colleagues from Ruhr University Bochum in Germany and University of Warsaw in Poland.

The paper illustrates an innovative way to protect modern cryptography against physical attacks. Cryptography is the science that studies techniques for secure communications in presence of third parties, which are usually malicious. The expression “Leakage-Resilient" stands for resistance against leaking of sensitive information. Information can in fact be leaked from encrypted data through a variety of techniques of physical nature, such as measuring of power consumption or running times during computation. The paper was created using mathematical techniques based on the properties of large finite fields, which is a particular type of algebraic structure. In particular, the sensitive information is encoded as pairs of vectors, which are strings of numbers, and then “masked” by applying the inner product function, which is a type of multiplication for vectors.

The annual ACNS conference has an average acceptance rate of 17.5% for the papers submitted for inclusion in the conference line-up. The average number of attendees every year is around 95, which includes an international committee and many attendees from all over the world.

For more information on ACNS 2015, go to http://acns2015.cs.columbia.edu/.